A MODEL FOR EDGE SPECTRAL-LINE EMISSION AND APPLICATION TO ION TEMPERATURE-MEASUREMENTS WITH CHARGE-EXCHANGE RECOMBINATION SPECTROSCOPY

被引：9
|
作者：
SYNAKOWSKI, EJ
BELL, RE
BUSH, CE
机构：
[1] Princeton Plasma Physics Laboratory, Princeton
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 01期
关键词：
D O I：
10.1063/1.1146316
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A model for characterizing the cold edge component of spectra measured in charge-exchange recombination spectroscopy (CHERS) applications is presented. It provides a rapid means of constraining the amplitude and width of the cold component of spectra for which the characteristics of the hot charge-exchange emission are desired. The model utilizes the CHERS measurements themselves and measurements of the electron density near the radius of peak background emissivity. A comparison of model predictions with direct measurements of the background emission during neutral beam injection is presented. Influences of changes in background emission on the inferred ion temperature during a neutral beam pulse are discussed. © 1995 American Institute of Physics.
引用
收藏
页码：649 / 651
页数：3
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