IODINE ION MILLING OF COMPOUND SEMICONDUCTORS FOR TRANSMISSION ELECTRON-MICROSCOPY

被引：0

作者：

TANAKA, K

MORI, M

ISHIDA, Y

TANINO, M

机构：

[1] UNIV TOKYO,FAC ENGN,BUNKYO KU,TOKYO 113,JAPAN

[2] UNIV TOKYO,INST IND SCI,MINATO KU,TOKYO 106,JAPAN

[3] NIPPON STEEL CORP LTD,FUNDAMENTAL RES LABS,KAWASAKI 211,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1989年 / 38卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：315 / 315

页数：1

共 50 条

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