ION MILLING PROCEDURES FOR CROSS-SECTIONAL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY

被引：0

作者：

BULLELIEUWMA, CWT ^{[1
]}

机构：

[1] PHILIPS RES LABS,5600 JA EINDHOVEN,NETHERLANDS

来源：

SURFACE AND INTERFACE ANALYSIS | 1986年 / 9卷 / 1-6期

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：74 / 74

页数：1

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[1] CROSS-SECTIONAL SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
ABRAHAMS, MS
BUIOCCHI, CJ
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (08) : 3315 - 3316
[2] THE PREPARATION OF CROSS-SECTIONAL SPECIMENS OF THIN POORLY ADHERED SCALES FOR TRANSMISSION ELECTRON-MICROSCOPY
FOX, P
[J]. MICROSCOPY RESEARCH AND TECHNIQUE, 1992, 21 (04) : 369 - 370
[3] PREPARATION OF CROSS-SECTIONAL SPECIMENS OF CERAMIC THERMAL BARRIER COATINGS FOR TRANSMISSION ELECTRON-MICROSCOPY
UNAL, O
HEUER, AH
MITCHELL, TE
[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1990, 14 (04): : 307 - 312
[4] A NEW CROSS-SECTIONAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY
SWEENEY, J
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (03): : 918 - 920
[5] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY FOR POLYCRYSTALLINE SILICON FILMS
OPPOLZER, H
FALCKENBERG, R
DOERING, E
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (JAN): : 97 - 103
[6] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY STUDIES OF METALLIC MULTILAYERS
DEVEIRMAN, AEM
HAKKENS, FJG
DIRKS, AG
[J]. ULTRAMICROSCOPY, 1993, 51 (1-4) : 306 - 315
[7] ION MILLING OF INP SPECIMENS WITH AR/O2 FOR TRANSMISSION ELECTRON-MICROSCOPY
IVEY, DG
PIERCY, GR
[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1987, 5 (01): : 107 - 108
[8] LOCALIZED THINNING OF SEMICONDUCTOR NANOSTRUCTURES FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
VIEU, C
PEPIN, A
BENASSAYAG, G
GIERAK, J
LADAN, FR
[J]. MICROSCOPY OF SEMICONDUCTING MATERIALS 1993, 1993, (134): : 385 - 390
[9] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF SILICON-SILICIDE INTERFACES
FOLL, F
HO, PS
TU, KN
[J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (01) : 250 - 255
[10] A CHEMICAL THINNING TECHNIQUE FOR TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL SAMPLES
GABORIAUD, RJ
[J]. JOURNAL OF ELECTRONIC MATERIALS, 1983, 12 (05) : 837 - 844

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