X-RAY DIFFUSE-SCATTERING BY MICRODEFECTS IN SILICON PREPARED WITH THE CZOCHRALSKI METHOD

被引：0
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作者：
KOVEV, EK
BUBLIK, VT
POSTOLOV, VG
机构：
来源：
FIZIKA TVERDOGO TELA | 1985年 / 27卷 / 04期
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中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
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页码：1246 / 1248
页数：3
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