X-RAY-ABSORPTION AND PHOTOELECTRON SPECTROSCOPIES USING TOTAL-REFLECTION X-RAYS

被引：19

作者：

KAWAI, J

HAYAKAWA, S

KITAJIMA, Y

GOHSHI, Y

机构：

[1] UNIV TOKYO,DEPT APPL CHEM,TOKYO 113,JAPAN

[2] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN

来源：

ANALYTICAL SCIENCES | 1995年 / 11卷 / 03期

关键词：

X-RAY ABSORPTION SPECTROSCOPY; X-RAY PHOTOELECTRON SPECTROSCOPY; TOTAL REFLECTION X-RAY;

D O I：

10.2116/analsci.11.519

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

X-Ray absorption and X-ray photoelectron spectroscopic measurements of specular surfaces using grazing incidence soft X-rays carried out by the present authors are summarized. The merits of using a sample current induced by totally reflected X-rays are discussed. The probing depth of the sample current has been found to be restricted to within a very shallow surface. The application of the sample current X-ray absorption experiment to the depth profile analysis of flyash powders is described. Very clear X-ray photoelectron spectra excited by totally reflected X-rays are for the first time reported.

引用

页码：519 / 524

页数：6

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