SIMULATION AND EXPERIMENT IN X-RAY TOPOGRAPHY AND DIFFRACTOMETRY

X-ray double crystal topography and high resolution diffractometry reveal very small deformations of the crystal lattice. However, this information can be directly obtained from the topographs or diffractometer curves only if certain conditions are fulfilled. Generally a deformation model has to be used, that is compared to the measurements by simulation calculations based on the dynamical diffraction theory. Trial and error allow to adapt the parameters of the model. An example illustrates that with a few parameters an automatic fit is possible.