SIMULATION AND EXPERIMENT IN X-RAY TOPOGRAPHY AND DIFFRACTOMETRY

被引：1
|
作者：
KOHLER, R
机构：
[1] Max‐Planck‐Gesellschaft, Arbeitsgruppe „Röntgenbeugung an Schichtsystemen”︁, Humboldt‐Universität zu Berlin, Berlin, D-10117
来源：
CRYSTAL RESEARCH AND TECHNOLOGY | 1993年 / 28卷 / 06期
关键词：
D O I：
10.1002/crat.2170280606
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
X-ray double crystal topography and high resolution diffractometry reveal very small deformations of the crystal lattice. However, this information can be directly obtained from the topographs or diffractometer curves only if certain conditions are fulfilled. Generally a deformation model has to be used, that is compared to the measurements by simulation calculations based on the dynamical diffraction theory. Trial and error allow to adapt the parameters of the model. An example illustrates that with a few parameters an automatic fit is possible.
引用
收藏
页码：803 / 811
页数：9
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