共 50 条
- [22] ELLIPSOMETRIC METHODS TO IMPROVE FILM THICKNESS AND OPTICAL-PROPERTIES CHARACTERIZATION [J]. FIRST INTERNATIONAL MEETING ON ADVANCED PROCESSING AND CHARACTERIZATION TECHNOLOGIES: FABRICATION AND CHARACTERIZATION OF SEMICONDUCTOR OPTOELECTRONIC DEVICES AND INTEGRATED CIRCUITS, VOLS 1 AND 2, 1989, : A171 - A174
- [23] OPTICAL-PROPERTIES OF MNAL FILMS [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 51 (05): : 446 - 450
- [24] OPTICAL-PROPERTIES OF MANGANESE FILMS [J]. JOURNAL OF MATERIALS SCIENCE, 1987, 22 (06) : 1971 - 1974
- [25] OPTICAL-PROPERTIES OF SPUTTERED FILMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (02): : 260 - 260
- [26] OPTICAL-PROPERTIES OF TBFECO FILMS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 : 51 - 53
- [27] OPTICAL-PROPERTIES OF ZRNX FILMS [J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1981, 48 (09): : 562 - 563
- [28] OPTICAL-PROPERTIES OF SPUTTERED FILMS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (02) : 164 - 165
- [29] OPTICAL-PROPERTIES OF SILICON FILMS [J]. SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1985, 52 (03): : 184 - 185
- [30] OPTICAL-PROPERTIES OF ZNTE FILMS [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1987, 43 (01): : 81 - 84