COMPARISON OF THE ICOSAHEDRAL AND ALPHA-STRUCTURES OF AL-MN-SI WITH THE USE OF SOFT-X-RAY EMISSION-SPECTROSCOPY

被引：6
|
作者：
BRUHWILER, PA
SHEN, Y
SCHNATTERLY, SE
POON, SJ
机构：
来源：
PHYSICAL REVIEW B | 1987年 / 36卷 / 14期
关键词：
D O I：
10.1103/PhysRevB.36.7347
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：7347 / 7352
页数：6
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