SOFT-X-RAY EMISSION-SPECTROSCOPY USING SYNCHROTRON LIGHT EXCITATION

被引:0
|
作者
CALLCOTT, TA
EDERER, DL
ARAKAWA, ET
机构
[1] NBS,SYNCHROTRON ULTRAVIOLET RADIAT FACIL,WASHINGTON,DC 20234
[2] OAK RIDGE NATL LAB,DIV HLTH & SAFETY RES,OAK RIDGE,TN 37830
关键词
D O I
暂无
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:61 / 67
页数:7
相关论文
共 50 条
  • [1] SOFT-X-RAY EMISSION-SPECTROSCOPY USING MONOCHROMATIZED SYNCHROTRON RADIATION
    NORDGREN, J
    BRAY, G
    CRAMM, S
    NYHOLM, R
    RUBENSSON, JE
    WASSDAHL, N
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07): : 1690 - 1696
  • [2] APPLICATION OF A POSITION-SENSITIVE DETECTOR TO SOFT-X-RAY EMISSION-SPECTROSCOPY
    ZAHOROWSKI, W
    MITTERNACHT, J
    WIECH, G
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 1991, 2 (07) : 602 - 609
  • [3] AN EXAMINATION OF THE ELECTRONIC-STRUCTURE OF SIO BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    SCIMECA, T
    [J]. SOLID STATE COMMUNICATIONS, 1991, 77 (10) : 817 - 819
  • [4] MONITORING OF THE ALUMINUM NITRIDE SPUTTERING DEPOSITION BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    LEGRAND, PB
    DAUCHOT, JP
    HECQ, M
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 945 - 949
  • [5] ELECTRONIC BONDING OF BURIED INTERFACES DETERMINED BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    PERERA, RCC
    ZHANG, CH
    CALLCOTT, TA
    EDERER, DL
    [J]. JOURNAL OF APPLIED PHYSICS, 1989, 66 (08) : 3676 - 3681
  • [6] SOFT-X-RAY EMISSION-SPECTROSCOPY OF METASTABLE AL-CU ALLOYS
    KERTESZ, L
    AHMED, MA
    [J]. JOURNAL OF PHYSICS F-METAL PHYSICS, 1983, 13 (11): : 2235 - 2240
  • [7] MONITORING OF THIN-FILM SPUTTERING BY SOFT-X-RAY EMISSION-SPECTROSCOPY
    CLAESSON, Y
    WASSDAHL, N
    GEORGSON, M
    BRAY, G
    RIBBING, CG
    NORDGREN, J
    [J]. VACUUM, 1990, 41 (4-6) : 1275 - 1278
  • [8] NONDESTRUCTIVE DEPTH PROFILING USING SOFT-X-RAY EMISSION-SPECTROSCOPY BY INCIDENT ANGLE VARIATION METHOD
    YAMAUCHI, S
    HIRAI, M
    KUSAKA, M
    IWAMI, M
    NAKAMURA, H
    MINOMURA, S
    WATABE, H
    KAWAI, M
    SOEZIMA, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (2A): : 395 - 400
  • [9] IN-SITU MONITORING OF HFCVD DIAMOND GROWTH ON NICKEL USING SOFT-X-RAY EMISSION-SPECTROSCOPY
    SKYTT, P
    JOHANSSON, E
    CARLSSON, JO
    WASSDAHL, N
    NORDGREN, J
    [J]. VACUUM, 1995, 46 (8-10) : 1053 - 1054
  • [10] SOFT-X-RAY SPECTROSCOPY - EXCITATION AND DISPERSION
    ANDERMANN, G
    HENKE, B
    URCH, DS
    WIECH, G
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 : 428 - 432