ANNEALING OF FATIGUED COPPER IN ELECTRON-MICROSCOPE

被引:1
|
作者
GONZALEZ, R [1 ]
PIQUERAS, J [1 ]
BRU, L [1 ]
机构
[1] UNIV COMPLUTENSE, FAC CIEN, DEPT FIS FUNDAMENTAL, MICROSCOPIA ELECTR LAB, MADRID, SPAIN
关键词
D O I
10.1002/pssa.2210340145
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K9 / +
页数:1
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