AUTOMATIC REFLECTION LOCATION WITH X-RAY DIFFRACTOMETERS

被引：0

作者：

TEPLITSKII, DM

TITOVETS, YF

机构：

来源：

INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1981年 / 24卷 / 02期

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：550 / 552

页数：3

共 50 条

[21] CALIBRATION OF HOT CHAMBERS OF ATTACHMENTS TO X-RAY DIFFRACTOMETERS
BOGUN, GM
GUSEV, KA
PETKOV, VV
POLENUR, AV
[J]. INDUSTRIAL LABORATORY, 1985, 51 (09): : 827 - 830
[22] STEPPING MECHANISM FOR X-RAY AND NEUTRON DIFFRACTOMETERS AND SPECTROMETERS
MUELLER, MH
JOHANSON, EW
HEATON, L
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1961, 32 (04): : 456 - &
[23] GEOMETRY, ALIGNMENT AND ANGULAR CALIBRATION OF X-RAY DIFFRACTOMETERS
PARRISH, W
LOWITZSCH, K
[J]. AMERICAN MINERALOGIST, 1959, 44 (7-8) : 765 - 787
[24] X-ray Reflection
Fabian, A. C.
Ross, R. R.
[J]. SPACE SCIENCE REVIEWS, 2010, 157 (1-4) : 167 - 176
[25] X-ray Reflection
A. C. Fabian
R. R. Ross
[J]. Space Science Reviews, 2010, 157 : 167 - 176
[26] RESOLUTION INVESTIGATIONS OF X-RAY 3-CRYSTAL DIFFRACTOMETERS
BRUGEMANN, L
BLOCH, R
PRESS, W
TOLAN, M
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1992, 48 : 688 - 692
[27] DETERMINATION OF APERTURES IN FOCUSING PLANE OF X-RAY POWDER DIFFRACTOMETERS
PARRISH, W
MACK, M
TAYLOR, J
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1966, 43 (09): : 623 - &
[28] UTILIZATION OF SPECULAR X-RAY REFLECTION, DIFFUSE X-RAY REFLECTION OR PLANAR X-RAY REFLECTION TO STUDY THIN-FILMS OR SURFACES
CROCE, P
NEVOT, L
[J]. REVUE DE PHYSIQUE APPLIQUEE, 1976, 11 (01): : 113 - 125
[29] Powder X-ray diffraction applications with single crystal diffractometers
He, Bob
Noll, Bruce
Campana, Charles
[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2017, 73 : C556 - C556
[30] INDUSTRIAL X-RAY DIFFRACTOMETERS CONTROL FOR EUROPEAN ALUMINUM SMELTER
KEULEN, E
[J]. METALL, 1992, 46 (04): : 329 - 332

← 1 2 3 4 5 →