SIMPLE METHOD OF MEASURING DRIFT-MOBILITY PROFILES IN THIN SEMICONDUCTOR-FILMS

被引：70

作者：

PUCEL, RA ^{[1
]}

KRUMM, CF ^{[1
]}

机构：

[1] RAYTHEON CO,DIV RES,WALTHAM,MA 02154

来源：

ELECTRONICS LETTERS | 1976年 / 12卷 / 10期

关键词：

D O I：

10.1049/el:19760186

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：240 / 242

页数：3

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