Circuit model of transient cross-coupling

被引:0
|
作者
Darney, Ian Brook
机构
来源
关键词
signal generators; assembling; circuit testing; circuit reliability; frequency-domain analysis; time-domain analysis; electromagnetic interference; electromagnetic compatibility; transient cross-coupling model; signal generator; oscilloscope; differential-mode current; common-mode current; twin-conductor cable; half-wave resonance; triple-T circuit model; assembly; square wave generation; photograph; bench testing; frequency domain analysis; time domain analysis; transient interference analysis; electromagnetic interference analysis; single-point ground; equipotential ground;
D O I
10.1049/joe.2017.0382
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using a signal generator and an oscilloscope, measurements were made of the differential-mode current and the common-mode current in a twin-conductor cable installed on a test rig, over a range of frequencies which included half-wave resonances. Test data was used to assign component values to a Triple-T circuit model of the assembly. This model was then transformed into a transient coupling model. The signal generator was reset to generate square waves, and photographs were taken of the waveforms of the input voltage and the common-mode current. A close correlation was achieved between these waveforms and those of the transient coupling model. This demonstrates that the technique of circuit modelling and bench testing is reliable and accurate, in both the frequency domain and the time domain. The technique allows potential hazards due to transient interference to be analysed, tested, and quantified during the design process. Electromagnetic interference can be analysed without recourse to the mathematics of full-field modelling. It is also shown that, from the point of view of Electromagnetic Compatibility, the concepts of the single-point ground and the equipotential ground are both misleading and counter-productive.
引用
收藏
页码:76 / 87
页数:12
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