A NOTE ON GENETIC ALGORITHMS FOR LARGE-SCALE FEATURE-SELECTION

被引:618
|
作者
SIEDLECKI, W
SKLANSKY, J
机构
关键词
D O I
10.1016/0167-8655(89)90037-8
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
引用
收藏
页码:335 / 347
页数:13
相关论文
共 50 条
  • [21] FEATURE-SELECTION WITH LIMITED TRAINING SAMPLES
    KALAYEH, HM
    MUASHER, MJ
    LANDGREBE, DA
    [J]. IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 1983, 21 (04): : 434 - 438
  • [22] Ambiguity Measure Feature-Selection Algorithm
    Mengle, Saket S. R.
    Goharian, Nazli
    [J]. JOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY, 2009, 60 (05): : 1037 - 1050
  • [24] Genetic algorithms in feature and instance selection
    Tsai, Chih-Fong
    Eberle, William
    Chu, Chi-Yuan
    [J]. KNOWLEDGE-BASED SYSTEMS, 2013, 39 : 240 - 247
  • [25] Automatic feature selection by genetic algorithms
    Eberhardt, M
    Kossebau, FWH
    König, A
    [J]. ARTIFICIAL NEURAL NETS AND GENETIC ALGORITHMS, 2001, : 256 - 259
  • [26] Hybrid genetic algorithms for feature selection
    Oh, IS
    Lee, JS
    Moon, BR
    [J]. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2004, 26 (11) : 1424 - 1437
  • [27] Feature selection techniques and comparative studies for large-scale manufacturing processes
    Jeong, BW
    Cho, HB
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2006, 28 (09): : 1006 - 1011
  • [28] An approach for optimized feature selection in large-scale software product lines
    Lian, Xiaoli
    Zhang, Li
    Jiang, Jing
    Goss, William
    [J]. JOURNAL OF SYSTEMS AND SOFTWARE, 2018, 137 : 636 - 651
  • [29] Feature selection techniques and comparative studies for large-scale manufacturing processes
    Buhwan Jeong
    Hyunbo Cho
    [J]. The International Journal of Advanced Manufacturing Technology, 2006, 28 : 1006 - 1011
  • [30] Local Feature Selection for Large-Scale Data Sets With Limited Labels
    Yang, Tian
    Deng, Yanfang
    Yu, Bin
    Qian, Yuhua
    Dai, Jianhua
    [J]. IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING, 2023, 35 (07) : 7152 - 7163