DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS USING HIGH SCHOTTKY BARRIERS

被引：27
|
作者：
STOLT, L [1 ]
BOHLIN, K [1 ]
机构：
[1] UNIV UPPSALA,INST TECHNOL,DEPT ELECTR,S-75121 UPPSALA,SWEDEN
来源：
SOLID-STATE ELECTRONICS | 1985年 / 28卷 / 12期
关键词：
D O I：
10.1016/0038-1101(85)90045-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1215 / 1221
页数：7
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