ERASABLE NON-VOLATILE MEMORIES

被引：0
|
作者：
JAVETSKI, J
机构：
来源：
ELECTRONIC PRODUCTS MAGAZINE | 1982年 / 24卷 / 13期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：37 / 40
页数：4
相关论文
共 50 条
  • [41] Virtualize and share non-volatile memories in user space
    Chou, Chih Chieh
    Jung, Jaemin
    Reddy, A. L. Narasimha
    Gratz, Paul, V
    Voigt, Doug
    [J]. CCF TRANSACTIONS ON HIGH PERFORMANCE COMPUTING, 2020, 2 (01) : 16 - 35
  • [42] ASSET: Architectures for Smart Security of Non-Volatile Memories
    Swami, Shivam
    Mohanram, Kartik
    [J]. 2019 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2019), 2019, : 349 - 354
  • [43] Emerging non-volatile memories: magnetic and resistive technologies
    Dieny, B.
    Jagadish, Chennupati
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2013, 46 (07)
  • [44] NON-VOLATILE MEMORIES REJUVENATE AS BUBBLE PRICES BURST
    SEHR, RA
    [J]. MINI-MICRO SYSTEMS, 1983, 16 (12): : 41 - &
  • [45] Crested barrier in the tunnel stack of non-volatile memories
    Irrera, F
    Puzzilli, G
    [J]. MICROELECTRONICS RELIABILITY, 2005, 45 (5-6) : 907 - 910
  • [46] Proton radiation effects on nanocrystal non-volatile memories
    Verrelli, E.
    Tsoukalas, D.
    Kokkoris, M.
    Vlastou, R.
    Dimitrakis, P.
    Nonnand, P.
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (04) : 975 - 981
  • [47] Security of Emerging Non-Volatile Memories: Attacks and Defenses
    Shamsi, Kaveh
    Jin, Yier
    [J]. 2016 IEEE 34TH VLSI TEST SYMPOSIUM (VTS), 2016,
  • [48] Structural Characterization of Layers for Advanced Non-volatile Memories
    Giannakopoulos, K.
    Giannopoulos, J.
    Bousoulas, P.
    Verrelli, E.
    Tsoukalas, D.
    [J]. 2ND INTERNATIONAL MULTIDISCIPLINARY MICROSCOPY AND MICROANALYSIS CONGRESS, 2015, 164 : 9 - 17
  • [49] Charge pump with adaptive stages for non-volatile memories
    Palumbo, G
    Pappalardo, D
    Gaibotti, M
    [J]. IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, 2006, 153 (02): : 136 - 142
  • [50] AIM technology for non-volatile memories microelectronics devices
    Rigolli, Pier Luigi
    Rozzoni, Laura
    Turco, Catia
    Iessi, Umberto
    Polli, Marco
    Kassel, Elyakim
    Izikson, Pavel
    Avrahamov, Yosef
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XX, PTS 1 AND 2, 2006, 6152
12345