MEASUREMENT AND MODELING OF CHARGE FEEDTHROUGH IN N-CHANNEL MOS ANALOG SWITCHES

被引：33
|
作者：
WILSON, WB [1 ]
MASSOUD, HZ [1 ]
SWANSON, EJ [1 ]
GEORGE, RT [1 ]
FAIR, RB [1 ]
机构：
[1] AT&T BELL LABS,TECH STAFF,READING,PA 19604
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1985年 / 20卷 / 06期
关键词：
D O I：
10.1109/JSSC.1985.1052460
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
8
引用
收藏
页码：1206 / 1213
页数：8
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