DEVICE FOR REMOVING THIN-LAYERS FROM CRYSTALS

被引：0
|
作者：
FESH, RN
ZBYKOVSKAYA, NI
DZYADEK, AV
PANCHUK, OE
机构：
来源：
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES | 1984年 / 27卷 / 06期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1507 / 1508
页数：2
相关论文
共 50 条
  • [41] EXAFS OF ULTRA THIN-LAYERS OF CU
    DELCUETO, JA
    SHEVCHIK, NJ
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (20): : L833 - L836
  • [42] PROPERTIES OF THIN-LAYERS OF HARD CARBON
    DURAND, AM
    RICHARDT, A
    VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, 1990, 45 (254): : 406 - 409
  • [43] PHYSICAL AND NUMERICAL MODELING OF REFLECTIONS FROM INTERFACES AND THIN-LAYERS
    FISHER, DA
    GARDNER, GHF
    GEOPHYSICS, 1985, 50 (02) : 332 - 332
  • [44] QUARTERWAVE LAYERS - SIMULATION BY 3 THIN-LAYERS OF 2 MATERIALS
    HERRMANN, R
    APPLIED OPTICS, 1985, 24 (08): : 1183 - 1188
  • [45] THE EFFECTIVENESS OF THIN-LAYERS AS ULTRASONIC VISUALIZATION MEDIA
    ARCHERHALL, JA
    HUTCHINS, DA
    ULTRASONICS, 1981, 19 (02) : 77 - 80
  • [46] MICROSCRATCH TESTING TO CHARACTERIZE THE ADHESION OF THIN-LAYERS
    JULIASCHMUTZ, C
    HINTERMANN, HE
    SURFACE & COATINGS TECHNOLOGY, 1991, 48 (01): : 1 - 6
  • [47] THE DEFORMATION AND DAMAGE PROFILES IN THIN-LAYERS AT THE SURFACE
    TKACHEV, VD
    HOLZER, G
    CHELYADINSKII, AR
    DOKLADY AKADEMII NAUK BELARUSI, 1982, 26 (11): : 977 - 979
  • [48] OPTICAL-PROPERTIES OF THIN-LAYERS OF SIOX
    LEVY, Y
    JURICH, M
    SWALEN, JD
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (07) : 2601 - 2605
  • [49] ENERGY-LOSS IN THIN-LAYERS IN GEANT
    LASSILAPERINI, K
    URBAN, L
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 362 (2-3): : 416 - 422
  • [50] INTERACTION OF SURFACTANT WITH ANTISTATIC POLYMER THIN-LAYERS
    PIAO, DS
    IKADA, Y
    COLLOID AND POLYMER SCIENCE, 1994, 272 (03) : 244 - 250
12345