RAPID LATTICE EXPANSION AND INCREASED X-RAY REFLECTIVITY OF A MULTILAYER STRUCTURE DUE TO PULSED LASER-HEATING

被引：12
|
作者：
ZIGLER, A
UNDERWOOD, JH
ZHU, J
FALCONE, RW
机构：
[1] UNIV CALIF BERKELEY,DEPT PHYS,BERKELEY,CA 94720
[2] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,CTR X-RAY OPT,BERKELEY,CA 94720
来源：
APPLIED PHYSICS LETTERS | 1987年 / 51卷 / 23期
关键词：
D O I：
10.1063/1.98496
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1873 / 1875
页数：3
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  • [21] Study of interface correlation in W/C multilayer structure by specular and non-specular grazing incidence X-ray reflectivity measurements
    Biswas, A.
    Haque, S. Maidul
    Tripathi, S.
    De, Rajnarayan
    Rai, S.
    Bhattacharyya, D.
    Sahoo, N. K.
    [J]. JOURNAL OF APPLIED PHYSICS, 2015, 118 (16)
  • [22] Coherent x-ray source due to the quantum reflection of an electron beam from a laser-field phase lattice
    Avetissian, HK
    Mkrtchian, GF
    [J]. PHYSICAL REVIEW E, 2002, 65 (01):
  • [23] Phase transition kinetics of superionic H2O ice phases revealed by Megahertz X-ray free-electron laser-heating experiments
    Husband, R. J.
    Liermann, H. P.
    Mchardy, J. D.
    Mcwilliams, R. S.
    Goncharov, A. F.
    Prakapenka, V. B.
    Edmund, E.
    Chariton, S.
    Konopkova, Z.
    Strohm, C.
    Sanchez-Valle, C.
    Frost, M.
    Andriambariarijaona, L.
    Appel, K.
    Baehtz, C.
    Ball, O. B.
    Briggs, R.
    Buchen, J.
    Cerantola, V.
    Choi, J.
    Coleman, A. L.
    Cynn, H.
    Dwivedi, A.
    Graafsma, H.
    Hwang, H.
    Koemets, E.
    Laurus, T.
    Lee, Y.
    Li, X.
    Marquardt, H.
    Mondal, A.
    Nakatsutsumi, M.
    Ninet, S.
    Pace, E.
    Pepin, C.
    Prescher, C.
    Stern, S.
    Sztuk-Dambietz, J.
    Zastrau, U.
    Mcmahon, M. I.
    [J]. NATURE COMMUNICATIONS, 2024, 15 (01)
  • [24] Rapid x-ray reflectivity (XRR) characterization and process monitoring of multilayer Ta/Al2O3/Ta/SiO2/Si
    Leng, JM
    Opsal, J
    [J]. OPTICAL METROLOGY ROADMAP FOR THE SEMICONDUCTOR, OPTICAL, AND DATA STORAGE INDUSTRIES II, 2001, 4449 : 244 - 252
  • [25] Long-term performance and durability of Ir/B4C multilayer x-ray mirrors: focusing on composition, structure, and reflectivity properties
    Jafari, Atefeh
    Ferreira, Desiree D. M.
    Kadkhodazadeh, Shima
    Kasama, Takeshi
    Massahi, Sonny
    Svendsen, Sara
    Vu, Lan M.
    Henriksen, Peter L.
    Balogh, Zoltan M.
    Krumrey, Michael
    Cibik, Levent
    Christensen, Finn E.
    Shortt, Brian
    [J]. JOURNAL OF ASTRONOMICAL TELESCOPES INSTRUMENTS AND SYSTEMS, 2020, 6 (03)
  • [26] X-ray reflectivity study of layering transitions and the internal multilayer structure of films of three-block organosiloxane amphiphilic smectic liquid crystals at the air-water interface
    IbnElhaj, M
    Riegler, H
    Mohwald, H
    Schwendler, M
    Helm, CA
    [J]. PHYSICAL REVIEW E, 1997, 56 (02): : 1844 - 1852
  • [27] Lattice defect of interfacial layer in superhard TiN/Si3N4 multilayer films studied by fluorescence x-ray absorption fine structure
    Pan, Zhiyun
    Sun, Zhihu
    Xie, Zhi
    Xu, Junhua
    Kojima, Isao
    Wei, Shiqiang
    [J]. X-RAY ABSORPTION FINE STRUCTURE-XAFS13, 2007, 882 : 449 - +
  • [28] X-Ray Scattering Studies of the Surface Structure of Complex Oxide Films during Layer-by-Layer Growth via Pulsed Laser Deposition
    Brock, J. D.
    Ferguson, J. D.
    Woll, A. R.
    [J]. METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2010, 41A (05): : 1162 - 1166
  • [29] X-ray Absorption Fine-Structure and Optical Studies of AlZnO Nano-Thin Films Grown on Sapphire by Pulsed Laser Deposition
    Lan, Y. R.
    Liu, S. -P.
    Wei, C. C.
    Fu, Y. -C.
    Wu, Y. R.
    Chen, J. M.
    Horng, R. -H.
    Wuu, D. -S.
    Feng, Z. C.
    [J]. NANOSTRUCTURED THIN FILMS IV, 2011, 8104
  • [30] X-Ray Scattering Studies of the Surface Structure of Complex Oxide Films during Layer-by-Layer Growth via Pulsed Laser Deposition
    J.D. Brock
    J.D. Ferguson
    A.R. Woll
    [J]. Metallurgical and Materials Transactions A, 2010, 41 : 1162 - 1166
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