X-RAY AND ELECTRON-DIFFRACTION STUDY OF SINGLE-CRYSTAL BI2SR2CACU2OX

被引:19
|
作者
KAN, XB
KULIK, J
CHOW, PC
MOSS, SC
YAN, YF
WANG, JH
ZHAO, ZX
机构
[1] UNIV HOUSTON,TEXAS CTR SUPERCONDUCTIV,HOUSTON,TX 77204
[2] CHINESE ACAD SCI,INST PHYS,BEIJING,PEOPLES R CHINA
基金
美国国家科学基金会;
关键词
D O I
10.1557/JMR.1990.0731
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using both x-ray and electron diffraction, we have studied the incommensurate modulation structure in single crystal Bi2Sr2Cacu2Ox. Electron diffraction clearly indicates a small a*-axis component of the modulation wave vector k, along with the more familiar b*-axis component (0.004a* + 0.212b*). This tilt of the k-vector breaks the mirror symmetry perpendicular to a- and b-axes as well as the twofold symmetry about a- and b-axes. The modulated structure thereby has only a mirror plane normal to the c-axis. Intense x-ray streaking along the c-axis at several satellite reflections was considerably more pronounced than at the fundamental reflections, indicating a stacking disorder along the c-axis predominantly in the modulated structure. © 1990, Materials Research Society. All rights reserved.
引用
收藏
页码:731 / 736
页数:6
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