DENSITY MEASUREMENTS OF THIN EVAPORATED FILMS

被引：0

|

作者：

EBEL, H

WAGENDRI.A

JUDTMANN, H

机构：

来源：

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE | 1968年 / A 23卷 / 11期

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：1863 / &

相关论文

共 50 条

[21] ADHESION OF THIN EVAPORATED FILMS
KUWAHARA, K
NAKAHARA, S
NAKAGAWA, T
TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS, 1968, S 9 : 1034 - &
[22] EVAPORATED ALUMINUM THIN FILMS
THOMPSON, FE
LIBSCH, JF
SEMICONDUCTOR PRODUCTS AND SOLID STATE TECHNOLOGY, 1965, 8 (12): : 50 - &
[23] EVAPORATED INHOMOGENEOUS THIN FILMS
JACOBSSON, R
MARTENSSON, JO
APPLIED OPTICS, 1966, 5 (01) : 29 - +
[24] DENSITY MEASUREMENTS OF SOME THIN COPPER FILMS
WAINFAN, N
SCOTT, NJ
PARRATT, LG
JOURNAL OF APPLIED PHYSICS, 1959, 30 (10) : 1604 - 1609
[25] ACCURATE MEASUREMENTS OF THE DENSITY OF THIN SILICA FILMS
SCHALCHLI, A
BENATTAR, JJ
LICOPPE, C
EUROPHYSICS LETTERS, 1994, 26 (04): : 271 - 276
[26] MEASUREMENTS OF PINHOLE DENSITY IN THIN OXIDE FILMS
CHOI, SS
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1963, 110 (03) : C60 - C60
[27] APPARATUS FOR IN-SITU MEASUREMENTS OF OPTICAL PROPERTIES OF EVAPORATED THIN-FILMS
BLUZER, N
BAHL, SK
REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (09): : 1320 - 1323
[28] TEP MEASUREMENTS ON VACUUM-EVAPORATED TIN OXIDE THIN-FILMS
KUMAR, JS
RAO, SG
RAO, UVS
JOURNAL OF MATERIALS SCIENCE LETTERS, 1987, 6 (01) : 25 - 28
[29] REFLECTANCE AND TRANSMITTANCE MEASUREMENTS OF THIN EVAPORATED METALLIC FILMS IN THE INFRA-RED
OLDHAM, MS
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 634 - 635
[30] ELECTRICAL-CONDUCTIVITY MEASUREMENTS IN EVAPORATED TIN SULFIDE THIN-FILMS
DERAMAN, K
SAKRANI, S
ISMAIL, BB
WAHAB, Y
GOULD, RD
INTERNATIONAL JOURNAL OF ELECTRONICS, 1994, 76 (05) : 917 - 922

← 1 2 3 4 5 →