TRACE DETERMINATION OF SILICON BY HEAVY-ION ACTIVATION-ANALYSIS

被引：4
|
作者：
COLIN, M
FRIEDLI, C
LERCH, P
机构：
来源：
JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY | 1984年 / 84卷 / 02期
关键词：
D O I：
10.1007/BF02036975
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
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页码：355 / 361
页数：7
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