共 50 条
- [11] SURFACE OXIDATIONS OF COTTONS AND CHEMICALLY MODIFIED COTTONS BY HYPOCHLORITE OR UV-LIGHTABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1980, 180 (AUG): : 37 - CELLHINOJOSA, OSOIGNET, DMBENERITO, RR
- [12] CHARACTERIZATION OF CHARGE-TRANSFER COMPLEXES ON CHEMICALLY MODIFIED COTTONS BY ELECTRON-EMISSION SPECTROSCOPYABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1976, 172 (SEP3): : 25 - 25PERRIER, DMBENERITO, RR
- [13] Measuring the Extinction Index of Dielectric Films Using Frustrated Total Internal Reflectance SpectroscopyTechnical Physics Letters, 2018, 44 : 746 - 748V. B. NguyenL. A. Gubanova
- [14] Measuring the Extinction Index of Dielectric Films Using Frustrated Total Internal Reflectance SpectroscopyTECHNICAL PHYSICS LETTERS, 2018, 44 (08) : 746 - 748Nguyen, V. B.Gubanova, L. A.
- [15] DETECTION OF 1,1-DIMETHYLHYDRAZINE BY FRUSTRATED MULTIPLE INTERNAL REFLECTION SPECTROSCOPYAMERICAN INDUSTRIAL HYGIENE ASSOCIATION JOURNAL, 1966, 27 (03): : 272 - &PRAGER, MJ
- [16] Characterisation of thin amorphous silicon films with multiple internal reflectance spectroscopyJournal of Non-Crystalline Solids, 1996, 198-200 (pt 1): : 69 - 72Fameli, G.Della Sala, D.Roca, F.Gerardi, C.
- [17] Characterization of thin amorphous silicon films with multiple internal reflectance spectroscopyJOURNAL OF APPLIED PHYSICS, 1995, 78 (12) : 7269 - 7276Fameli, GdellaSala, DRoca, FPascarella, FGrillo, P
- [18] Characterisation of thin amorphous silicon films with multiple internal reflectance spectroscopyJOURNAL OF NON-CRYSTALLINE SOLIDS, 1996, 200 : 69 - 72Fameli, GDellaSala, DRoca, FGerardi, C
- [19] FLAME RETARDANCY OF CHEMICALLY MODIFIED COTTONS AFTER APPLICATION OF PYROVATEX CPABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1974, : 46 - 46MEHTA, RD
- [20] Reflectance spectroscopy for modified electrodeELECTROCHEMISTRY, 2002, 70 (07) : 560 - 563Sagara, T