REFRACTIVE-INDEX CHANGE AT TI DIFFUSION IN LITAO3

被引:0
|
作者
SHASHKIN, VV
机构
来源
FIZIKA TVERDOGO TELA | 1983年 / 25卷 / 12期
关键词
D O I
暂无
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:3719 / 3721
页数:3
相关论文
共 50 条
  • [41] PHOTOINDUCED REFRACTIVE-INDEX CHANGE IN A PHOTOCONDUCTIVE ELECTROOPTIC POLYMER
    KAWAKAMI, T
    SONODA, N
    [J]. APPLIED PHYSICS LETTERS, 1993, 62 (18) : 2167 - 2169
  • [42] CORRELATION OF REFRACTIVE-INDEX AND DENSITY IN OXIDE GLASSES OF HIGH REFRACTIVE-INDEX
    TIWARI, AN
    DAS, AR
    [J]. AMERICAN CERAMIC SOCIETY BULLETIN, 1972, 51 (09): : 695 - &
  • [43] Optical absorption and luminescence of LiTaO3:Cr and LiTaO3: Cr, Nd crystals
    Golab, S
    Sokólska, I
    Dominiak-Dzik, G
    Palatnikov, MN
    Sidorov, NV
    Biryukova, I
    Kalinnikov, VT
    Ryba-Romanowski, W
    [J]. SINGLE CRYSTAL GROWTH, CHARACTERIZATION, AND APPLICATIONS, 1999, 3724 : 270 - 273
  • [44] MEASUREMENT OF REFRACTIVE-INDEXES AND THERMAL REFRACTIVE-INDEX COEFFICIENTS OF THE TI-MG-LINBO3 CRYSTAL
    ZENG, ZD
    SHEN, HY
    HUANG, CH
    LIN, WX
    ZENG, RR
    ZHOU, YP
    YU, GF
    WE, JK
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1993, 10 (03) : 551 - 553
  • [45] REFRACTIVE-INDEX SURFACES
    STOTT, GF
    [J]. JOURNAL OF ATMOSPHERIC AND TERRESTRIAL PHYSICS, 1983, 45 (04): : 219 - 229
  • [46] REFRACTIVE-INDEX INTERPOLATION
    PITLAK, RT
    [J]. ELECTRO-OPTICAL SYSTEMS DESIGN, 1979, 11 (12): : 50 - 51
  • [47] REFRACTIVE-INDEX MEASUREMENT
    BHATTACHARYA, JC
    [J]. OPTICS AND LASER TECHNOLOGY, 1987, 19 (01): : 29 - 32
  • [48] ON THE REFRACTIVE-INDEX OF RUTILE
    SHENOY, MR
    DELARUE, RM
    [J]. IEE PROCEEDINGS-J OPTOELECTRONICS, 1992, 139 (02): : 163 - 165
  • [49] THE INTERPRETATION OF REFRACTIVE-INDEX MEASUREMENTS .3.
    EVETT, IW
    LAMBERT, JA
    [J]. FORENSIC SCIENCE INTERNATIONAL, 1982, 20 (03) : 237 - 245
  • [50] Weak Localization in Media with Refractive-Index Gradient: the Diffusion Approximation
    Ilyushin, Ya. A.
    [J]. RADIOPHYSICS AND QUANTUM ELECTRONICS, 2015, 57 (10) : 730 - 736