RELIABILITY OF INGAAS/INP LONG-WAVELENGTH P-I-N PHOTODIODES PASSIVATED WITH POLYIMIDE THIN-FILM

被引：18
|
作者：
KUHARA, Y
TERAUCHI, H
NISHIZAWA, H
机构：
来源：
JOURNAL OF LIGHTWAVE TECHNOLOGY | 1986年 / 4卷 / 07期
关键词：
D O I：
10.1109/JLT.1986.1074785
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：933 / 937
页数：5
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