THE PHOTOSENSITIVITY OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS

被引：23

|

作者：

VANBERKEL, C

POWELL, MJ

机构：

[1] Philips Research Lab, Redhill, Engl, Philips Research Lab, Redhill, Engl

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1985年 / 77-8卷

关键词：

D O I：

10.1016/0022-3093(85)90915-9

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

5

引用

收藏

页码：1393 / 1396

页数：4

相关论文

共 50 条

[1] AMORPHOUS-SILICON THIN-FILM TRANSISTORS
TSUKADA, T
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1993, 166 : 721 - 726
[2] AMORPHOUS-SILICON THIN-FILM TRANSISTORS
LIN, JL
LEE, SC
[J]. JOURNAL OF THE CHINESE INSTITUTE OF ENGINEERS, 1995, 18 (04) : 451 - 460
[3] AMORPHOUS-SILICON SUPERLATTICE THIN-FILM TRANSISTORS
TSUKUDE, M
AKAMATSU, S
MIYAZAKI, S
HIROSE, M
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1987, 26 (02): : L111 - L113
[4] VERTICAL AMORPHOUS-SILICON THIN-FILM TRANSISTORS
SHAW, JG
HACK, M
[J]. JOURNAL OF APPLIED PHYSICS, 1990, 67 (03) : 1576 - 1581
[5] STABILITY OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS
POWELL, MJ
NICHOLLS, DH
[J]. IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1983, 130 (01): : 2 - 4
[6] THE PHYSICS OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS
POWELL, MJ
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (12) : 2753 - 2763
[7] Stable amorphous-silicon thin-film transistors
Meiling, H
Schropp, REI
[J]. APPLIED PHYSICS LETTERS, 1997, 70 (20) : 2681 - 2683
[8] ANALYSIS OF AMORPHOUS-SILICON THIN-FILM TRANSISTORS
HACK, M
SHUR, M
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 : 1291 - 1294
[9] AMORPHOUS-SILICON SUPERLATTICE THIN-FILM TRANSISTORS
TSUKUDE, M
HATA, S
KOHDA, Y
MIYAZAKI, S
HIROSE, M
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 : 317 - 320
[10] DEFECT POOL IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS
POWELL, MJ
VANBERKEL, C
FRANKLIN, AR
DEANE, SC
MILNE, WI
[J]. PHYSICAL REVIEW B, 1992, 45 (08): : 4160 - 4170

← 1 2 3 4 5 →