EXTRAORDINARY HALL RESISTIVITY IN AMORPHOUS TERBIUM IRON THIN-FILMS AND ITS TEMPERATURE-DEPENDENCE

被引：32

作者：

MALMHALL, R ^{[1
]}

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

JOURNAL OF APPLIED PHYSICS | 1983年 / 54卷 / 09期

关键词：

D O I：

10.1063/1.332735

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5128 / 5131

页数：4

共 50 条

[41] SIZE AND TEMPERATURE-DEPENDENCE OF THERMOELECTRIC-POWER AND ELECTRICAL-RESISTIVITY OF VACUUM-DEPOSITED ANTIMONY THIN-FILMS
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[J]. JOURNAL OF MATERIALS SCIENCE, 1989, 24 (12) : 4315 - 4323
[42] TEMPERATURE-DEPENDENCE OF ELECTRICAL-RESISTIVITY AND STRUCTURE OF GDFE2 THIN-FILMS PRODUCED BY THE DISCHARGE WITH OSCILLATING ELECTRONS
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[J]. VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 3 FIZIKA ASTRONOMIYA, 1986, 27 (05): : 49 - 53
[43] TEMPERATURE-DEPENDENCE OF HALL-EFFECT AND RESISTIVITY OF PURE COBALT
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[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 23 (01): : K41 - K44
[44] TEMPERATURE-DEPENDENCE OF THE HALL RESISTIVITY OF AMORPHOUS CO76P24 ELECTROLYTICALLY PREPARED SAMPLES
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ZIMAN, J
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[J]. ACTA PHYSICA SLOVACA, 1985, 35 (4-5) : 306 - 308
[45] THICKNESS DEPENDENCE OF RESISTIVITY IN IN-BI THIN-FILMS
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JAGADEESH, MS
[J]. VACUUM, 1981, 31 (01) : 15 - 17
[46] TEMPERATURE-DEPENDENCE OF STANDING SPIN-WAVE RESONANCE IN FERROMAGNETIC THIN-FILMS
ZYMIERSKA, D
KOWALEWSKI, L
[J]. THIN SOLID FILMS, 1976, 34 (02) : 271 - 273
[47] ELECTRONOGRAPHIC DETERMINATION OF TEMPERATURE-DEPENDENCE OF DIFFRACTION MAXIMA INTENSITY OF LEAD THIN-FILMS
TSALYI, ZP
[J]. FIZIKA METALLOV I METALLOVEDENIE, 1973, 36 (04): : 875 - 877
[48] TEMPERATURE-DEPENDENCE OF INFRARED-SPECTRA OF TTF(TCNQ) THIN-FILMS ON KBR
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ROBERT, H
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[J]. SOLID STATE COMMUNICATIONS, 1976, 20 (03) : 257 - 259
[49] HALL-COEFFICIENT AND RESISTIVITY OF HYDROGENATED PD IN THIN-FILMS
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CLARK, N
[J]. ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE NEUE FOLGE, 1989, 163 : 621 - 626
[50] TEMPERATURE-DEPENDENCE OF THE ELECTRICAL-RESISTIVITY OF POTASSIUM FILMS
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[J]. PHYSICAL REVIEW B, 1989, 40 (09): : 5967 - 5972

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