共 50 条
- [23] Hot-carrier reliability and design of N-LDMOS transistor arrays 2001 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT, 2001, : 44 - 48
- [25] INFLUENCE OF THE INTERNAL FIELD OF AN N-N+ JUNCTION ON ITS ELECTRICAL-PROPERTIES SOVIET PHYSICS SEMICONDUCTORS-USSR, 1978, 12 (08): : 905 - 910
- [28] HOT-CARRIER HALL MOBILITY AND MAGNETORESISTANCE IN N-TYPE GERMANIUM OF LARGE CARRIER CONCENTRATION PHYSICAL REVIEW, 1966, 148 (02): : 885 - &
- [30] Hot-carrier reliability in n-MOSFETs used as pass-transistors MICROELECTRONICS AND RELIABILITY, 1998, 38 (04): : 539 - 544