X-RAY-DIFFRACTION CONTRAST OF POLYCRYSTALLINE MATERIAL, VISUALIZED BY SCANNING-X-RAY ANALYTICAL MICROSCOPE

An X-ray diffraction image of polycrystalline material was obtained by using a scanning X-ray analytical microscope (SXAM): An X-ray microbeam illuminates a, small area (10 mu m phi ) of a sample. A solid state detector (SSD) detects the secondary X-rays, and their intensities are stored in a micro computer. These processes are repeated for all points of a desired area. X-ray images can be constructed by using the intensity data of all the points as picture elements. The image of the distribution of crystallites, of hydroxyapatite of a fish tooth demonstrates successfully SXAM's capabilities.