ANNULAR-TYPE SOLID-STATE DETECTOR FOR A SCANNING-X-RAY ANALYTICAL MICROSCOPE

An annular-type solid state detector (SSD) was attached to a scanning x-ray analytical microscope to accomplish certain superior analytical features. The major advantages of this kind of attachment are a large solid angle for detection of scattered x rays from a small point covering the entire Debye-Sherrer ring diffracted from a polycrystalline sample. To demonstrate the above features, the crystallite distribution of an agate sample was depicted as a micrograph using the diffraction intensities of 10 (1) over bar 1 reflection of quartz. For comparison and to emphasize the special features of the present setup, a similar observation was also carried out by a conventional SSD. (C) 1995 American Institute of Physics.