NEUTRON AND X-RAY REFLECTIVITY MEASUREMENTS OF POLYSTYRENE POLYBROMOSTYRENE (PS PBRS) INTERFACES

被引：26
|
作者：
ZHAO, W
ZHAO, X
RAFAILOVICH, MH
SOKOLOV, J
MANSFIELD, T
STEIN, RS
COMPOSTO, RC
KRAMER, EJ
JONES, RAL
SANSONE, M
NELSON, M
机构：
[1] UNIV MASSACHUSETTS,AMHERST,MA 01033
[2] UNIV PENN,PHILADELPHIA,PA 19104
[3] CORNELL UNIV,ITHACA,NY 14853
[4] UNIV CAMBRIDGE,CAMBRIDGE CB3 OHE,ENGLAND
[5] EXXON RES & ENGN CO,ANNANDALE,NJ 08801
[6] BROOKHAVEN NATL LAB,UPTON,NY 11973
来源：
PHYSICA B | 1991年 / 173卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1016/0921-4526(91)90033-B
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Comparative X-ray and neutron reflectivity (XR and NR) measurements were made to study interface formation in the highly immiscible polymer pair deuterated polystyrene/polybromostyrene (PS/PBrS). Since deuterium provides the scattering contrast for NR while electronic density differences give XR contrast, the experiments constitute independent high-resolution measurements of the same interface. For the (PBrS) (670K)/dPS(730K) interface we find the interfacial width, 39 +/- 5 angstrom by XR and 41 +/- 5 angstrom by NR to be in satisfactory agreement.
引用
收藏
页码：43 / 46
页数：4
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