共 50 条
- [41] COMPARISON OF CONVERGENT-BEAM ELECTRON-DIFFRACTION METHODS FOR DETERMINATION OF FOIL THICKNESS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 52 (06): : L59 - L63
- [42] CHARACTERIZATION OF ICOSAHEDRAL QUASI-CRYSTALS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION [J]. SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY, 1991, 36 (01): : 159 - 166
- [44] APPLICATION OF IMAGING PLATES IN OBSERVING CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J]. JOURNAL OF ELECTRON MICROSCOPY, 1991, 40 (04): : 279 - 279
- [45] STUDY OF THE IRON-NITROGEN PHASES BY ELECTRON MICRODIFFRACTION AND CONVERGENT-BEAM ELECTRON-DIFFRACTION [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1993, 4 (06): : 575 - 594
- [47] MEASUREMENT OF STRAIN IN LOCALLY OXIDIZED SILICON USING CONVERGENT-BEAM ELECTRON-DIFFRACTION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1993, 32 (2A): : L211 - L213
- [49] STRAIN DISTRIBUTION MEASUREMENT IN STAINLESS-STEELS BY CONVERGENT-BEAM ELECTRON-DIFFRACTION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (01): : 350 - 354
- [50] DISLOCATION CONTRAST IN LARGE-ANGLE CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1992, 65 (04): : 863 - 888