LAYER-BY-LAYER NEUTRON-ACTIVATION DETERMINATION OF PHOSPHORUS AND ANTIMONY IN SILICON STRUCTURES

被引：0
|
作者：
GOLDSHTEIN, MM
GILBERT, EN
YUDELEVICH, IG
机构：
来源：
JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR | 1983年 / 38卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：803 / 805
页数：3
相关论文
共 50 条
  • [21] RADIOCHEMICAL NEUTRON-ACTIVATION DETERMINATION OF PHOSPHORUS IN HIGH PURE GERMANIUM
    KOLOTOV, VP
    SADYKOV, II
    DOGADKIN, NN
    NEKRASOVA, NN
    [J]. JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES, 1993, 168 (02): : 465 - 470
  • [22] Layer-by-layer oxidation of silicon surfaces
    Watanabe, H
    Miyata, N
    Ichikawa, M
    [J]. ULTRATHIN SIO2 AND HIGH-K MATERIALS FOR ULSI GATE DIELECTRICS, 1999, 567 : 189 - 200
  • [23] LAYER-BY-LAYER MASS-SPECTROMETRIC ANALYSIS OF SILICON STRUCTURES BY MEANS OF STANDARDS
    YUDELEVICH, IG
    SHELPAKOVA, IR
    SHABANOVA, LN
    GERASIMOV, VA
    KORDA, TM
    [J]. JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1976, 31 (03): : 474 - 476
  • [24] Layer-By-Layer Assembly of Cellular Structures
    Matosevic, Sandro
    Paegel, Brian M.
    [J]. BIOPHYSICAL JOURNAL, 2012, 102 (03) : 28A - 28A
  • [25] Layer-by-layer deposition of nanoscale structures
    Kumar, Abhishek
    Kumar, Jayant
    [J]. JOURNAL OF NANOPHOTONICS, 2009, 3
  • [26] Modeling and Optimization of Layer-by-Layer Structures
    Lychev, S. A.
    Kostin, G. V.
    Koifman, K. G.
    Lycheva, T. N.
    [J]. 11TH INTERNATIONAL CONFERENCE AEROPHYSICS AND PHYSICAL MECHANICS OF CLASSICAL AND QUANTUM SYSTEMS (APHM-2017), 2018, 1009
  • [27] STUDY OF PHOSPHORUS GETTERING OF GOLD IN SILICON BY USE OF NEUTRON-ACTIVATION ANALYSIS
    MURARKA, SP
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (05) : 765 - 767
  • [28] METHOD FOR DETERMINATION OF SILICON IN PLANT MATERIALS BY NEUTRON-ACTIVATION ANALYSIS
    JONES, JD
    KAUFMAN, PB
    RIGOT, WL
    [J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1979, 50 (1-2): : 261 - 275
  • [29] STUDY OF PURITY OF SEMICONDUCTOR SILICON PLATES, AND DETERMINATION OF CONCENTRATION PROFILES OF GALLIUM AND PHOSPHORUS BY NEUTRON-ACTIVATION AND AUTORADIOGRAPHY
    JASKOLSKA, H
    WALIS, L
    ROWINSKA, L
    [J]. RADIOCHEMICAL AND RADIOANALYTICAL LETTERS, 1975, 20 (4-5): : 229 - 239
  • [30] METHOD FOR DETERMINATION OF SILICON IN PLANT MATERIALS BY NEUTRON-ACTIVATION ANALYSIS
    JONES, JD
    KAUFMAN, PB
    RIGOT, WL
    [J]. PLANT PHYSIOLOGY, 1978, 61 (04) : 78 - 78
12345