MEASUREMENT OF SURFACE-DEFECTS BY LOW-ENERGY ELECTRON-DIFFRACTION

被引：107

|

作者：

HENZLER, M

机构：

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1984年 / 34卷 / 04期

关键词：

D O I：

10.1007/BF00616574

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：205 / 214

页数：10

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