共 50 条
- [31] ANALYSIS OF ELECTRON-MICROSCOPE IMAGES AND ELECTRON-DIFFRACTION PATTERNS OF THIN-CRYSTALS OF 029-CONNECTORS IN ICEJOURNAL OF MOLECULAR BIOLOGY, 1994, 240 (04) : 281 - 287VALPUESTA, JMCARRASCOSA, JLHENDERSON, R
- [32] PHASE-TRANSITIONS IN C-60 AND THE RELATED MICROSTRUCTURE - A STUDY BY ELECTRON-DIFFRACTION AND ELECTRON-MICROSCOPYJOURNAL OF PHYSICAL CHEMISTRY, 1992, 96 (18): : 7424 - 7430VANTENDELOO, GVANHEURCK, CVANLANDUYT, JAMELINCKX, SVERHEIJEN, MAVANLOOSDRECHT, PHMMEIJER, G
- [33] DEPOSITION OF THIN-FILMS IN ELECTRON-MICROSCOPEZAVODSKAYA LABORATORIYA, 1972, 38 (04): : 471 - +ZHDANOV, GSVERTSNER, VN
- [34] ELECTRON-DIFFRACTION INVESTIGATION OF THIN CDS FILMSSOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1968, 12 (05): : 766 - &GALKIN, BDTROITSKA.NVIVANOV, RD
- [35] STUDIES OF THIN-FILMS WITH A SCANNING-TRANSMISSION ELECTRON-MICROSCOPEJOURNAL OF METALS, 1980, 32 (12): : 56 - 56COWLEY, JM
- [36] ELECTRON-DIFFRACTION STUDY OF CDINGAS4 THIN-FILMSTHIN SOLID FILMS, 1983, 100 (03) : 175 - 179ABDULLAYEV, AGKYASIMOV, MG
- [37] SCANNING ELECTRON-DIFFRACTION STUDIES OF NUCLEATING FILMSJOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1967, S : 611 - &GRIGSON, CWB
- [38] ELECTRON-DIFFRACTION AND DIFFRACTION CONTRAST IMAGING OF THIN ORGANIC FILMSJOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 11 (04): : 286 - 297HUI, SW
- [39] DETERMINATION OF LONG-RANGE ORDER PARAMETER IN ALLOYS BY MEANS OF ELECTRON-DIFFRACTION IN THE ELECTRON-MICROSCOPEPHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 87 (02): : 459 - 471URBAN, K
- [40] RAMAN AND FAR IR STUDIES ON AG2CDI4 AND CU2CDI4 SUPERIONIC COMPOUNDSSOLID STATE IONICS, 1984, 13 (04) : 277 - 283SUDHARSANAN, RSRINIVASAN, TKKRADHAKRISHNA, S