A STATISTICAL-MODEL FOR INTEGRATED-CIRCUIT YIELD WITH CLUSTERED FLAWS

被引：4

作者：

SHIER, J

机构：

来源：

关键词：

D O I：

10.1109/16.2490

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：524 / 525

页数：2

共 50 条

[21] INVENTION OF INTEGRATED-CIRCUIT
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