A STATISTICAL-MODEL FOR INTEGRATED-CIRCUIT YIELD WITH CLUSTERED FLAWS

被引：4
|
作者：
SHIER, J
机构：
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1988年 / 35卷 / 04期
关键词：
D O I：
10.1109/16.2490
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：524 / 525
页数：2
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