SURFACE PHOTOVOLTAGE SPECTROSCOPY AND MAPPING BY ATOMIC-FORCE MICROSCOPY

被引：2
|
作者：
JIANG, L
NAGAHARA, LA
HASHIMOTO, K
FUJISHIMA, A
机构：
来源：
CHEMISTRY LETTERS | 1994年 / 10期
关键词：
D O I：
10.1246/cl.1994.1975
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
We have adapted an atomic force microscope (AFM) for the purpose of performing surface photovoltage (SPV) spectroscopy. SPV spectra were obtained from p-type Si (100) and TiO2 (100) test samples over a wavelength region between 300-800 nm. Simultaneous AFM topography and SPV mapping was also conducted. The boundary between a polymer coating and bare Si substrate was used to test the mapping capability.
引用
收藏
页码：1975 / 1978
页数：4
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