SURFACE-SENSITIVE CHARACTERIZATION OF DIAMOND BY IONIZATION ELECTRON-ENERGY-LOSS SPECTROSCOPY

被引：1
|
作者：
TSCHERSICH, KG [1 ]
CLAUSING, RE [1 ]
HEATHERLY, L [1 ]
机构：
[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, JULICH, INST GRENZFLACHENFORSCH & VAKUUMPHYS, W-5170 JULICH 1, GERMANY
来源：
DIAMOND AND RELATED MATERIALS | 1993年 / 2卷 / 2-4期
关键词：
D O I：
10.1016/0925-9635(93)90117-K
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Ionization loss spectroscopy has been performed on diamond deposited by chemical vapor deposition and on graphite by use of conventional Auger equipment (backscattering geometry). The results are compared with reported data on natural diamond and on graphite. Polycrystalline chemical-vapor-deposited diamond exhibits a spectrum similar to that of natural, single-crystal diamond. Reference is also made to ionization loss spectroscopy in the transmission electron microscope and to near-edge, X-ray absorption fine structure measurements. The prominent features of the measured spectra are correlated with pi and sigma bonding. The applied method is sensitive to pi bonding as well as being surface sensitive and, therefore, is particularly suited to check the deviation from perfect diamond bonding at the surface.
引用
收藏
页码：542 / 547
页数：6
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