共 50 条
- [33] FORMATION OF EXCELLENT SHALLOW N+P JUNCTIONS BY AS+ IMPLANTATION INTO THIN COSI FILMS ON SI SUBSTRATE NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 74 (1-2): : 147 - 150
- [35] Formation and characterizations of ultra-shallow p+-n junctions using B10H14 ion implantation NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 206 : 409 - 412
- [37] FORMATION OF SHALLOW P+ JUNCTIONS BY IMPLANTATION INTO SILICIDE JOURNAL DE PHYSIQUE, 1988, 49 (C-4): : 507 - 510
- [38] Electrical defects of shallow (P+/N) junctions formed by boron implantation into Ge-preamorphized Si-substrates DEFECTS AND DIFFUSION IN SILICON PROCESSING, 1997, 469 : 413 - 418
- [39] FORMATION OF P-N-JUNCTIONS IN PBS BY ION-IMPLANTATION SOVIET PHYSICS SEMICONDUCTORS-USSR, 1990, 24 (11): : 1271 - 1272
- [40] The use of SiGe barriers during the formation of p+ shallow junctions by ion implantation SILICON FRONT-END JUNCTION FORMATION-PHYSICS AND TECHNOLOGY, 2004, 810 : 177 - 182