MEMBRANE CHARACTERIZATION BY MEANS OF PNEUMATIC SCANNING FORCE MICROSCOPY

被引:9
|
作者
KAMUSEWITZ, H
KELLER, M
PAUL, D
机构
[1] GKSS Research Centre Geesthacht GmbH, Institute of Chemistry, D-14513 Teltow
关键词
SCANNING FORCE MICROSCOPY; MEMBRANES; SURFACE MORPHOLOGY; SURFACE STRUCTURE;
D O I
10.1016/0040-6090(95)05854-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Different types of flat and hollow fibre membranes have been imaged by means of both common scanning force microscopy and, a new application especially for porous materials, pneumatic scanning force microscopy. This technique enables us to obtain more specific information about the actual volume, the diameter and the distribution of pores through which the gas is streaming. A comparison of the silicon-nitride tip and the NanoProbe shows that the latter is the only one suited to obtaining clear images.
引用
收藏
页码:184 / 193
页数:10
相关论文
共 50 条
  • [21] Scanning force microscopy characterization of biopolymer films: Gelatin on mica
    Haugstad, G
    Gladfelter, WL
    Weberg, EB
    Weberg, RT
    Weatherill, TD
    ATOMIC FORCE MICROSCOPY/SCANNING TUNNELING MICROSCOPY 2, 1997, : 65 - 73
  • [22] Quantitative characterization of shear force regulation for scanning electrochemical microscopy
    Tefashe, Ushula Mengesha
    Wittstock, Gunther
    COMPTES RENDUS CHIMIE, 2013, 16 (01) : 7 - 14
  • [23] ELECTRICAL CHARACTERIZATION OF INTEGRATED-CIRCUITS BY SCANNING FORCE MICROSCOPY
    BOHM, C
    ROTHS, C
    MULLER, U
    BEYER, A
    KUBALEK, E
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 24 (1-3): : 218 - 222
  • [24] Scanning force microscopy characterization of thin lipid films on a substrate
    Mitsubishi Chemical Corp, Yokohama, Japan
    Thin Solid Films, 1-2 (289-296):
  • [25] Scanning force microscopy characterization of thin lipid films on a substrate
    Masai, J
    ShibataSeki, T
    Sasaki, K
    Murayama, H
    Sano, K
    THIN SOLID FILMS, 1996, 273 (1-2) : 289 - 296
  • [26] Surface morphological characterization of yeast cells by scanning force microscopy
    Méndez-Vilas, A
    Gallardo, AM
    Pérez-Giraldo, C
    González-Martín, ML
    Nuevo, MJ
    SURFACE AND INTERFACE ANALYSIS, 2001, 31 (11) : 1027 - 1030
  • [27] CHARACTERIZATION OF PHOTODEPOSITED SELENIUM PLANAR STRUCTURES BY SCANNING FORCE MICROSCOPY
    PELED, A
    BARANAUSKAS, V
    RODRIGUES, C
    ARTWEISMAN, D
    GRANTMAN, L
    FRIESEM, AA
    JOURNAL OF APPLIED PHYSICS, 1995, 77 (12) : 6208 - 6213
  • [28] SEMICONDUCTOR CHARACTERIZATION BY SCANNING FORCE MICROSCOPE SURFACE PHOTOVOLTAGE MICROSCOPY
    WEAVER, JMR
    WICKRAMASINGHE, HK
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (03): : 1562 - 1565
  • [29] Membrane characterization by solute transport and atomic force microscopy
    Singh, S
    Khulbe, KC
    Matsuura, T
    Ramamurthy, P
    JOURNAL OF MEMBRANE SCIENCE, 1998, 142 (01) : 111 - 127
  • [30] Characterization of Cell Membrane using Atomic Force Microscopy
    Liu, Lin
    Wei, Yuhui
    Wang, Kaizhe
    Wang, Lihua
    Hu, Jun
    Li, Bin
    BIOPHYSICAL JOURNAL, 2019, 116 (03) : 430A - 430A