MEMBRANE CHARACTERIZATION BY MEANS OF PNEUMATIC SCANNING FORCE MICROSCOPY

被引：9
|
作者：
KAMUSEWITZ, H
KELLER, M
PAUL, D
机构：
[1] GKSS Research Centre Geesthacht GmbH, Institute of Chemistry, D-14513 Teltow
来源：
THIN SOLID FILMS | 1995年 / 264卷 / 02期
关键词：
SCANNING FORCE MICROSCOPY; MEMBRANES; SURFACE MORPHOLOGY; SURFACE STRUCTURE;
D O I：
10.1016/0040-6090(95)05854-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Different types of flat and hollow fibre membranes have been imaged by means of both common scanning force microscopy and, a new application especially for porous materials, pneumatic scanning force microscopy. This technique enables us to obtain more specific information about the actual volume, the diameter and the distribution of pores through which the gas is streaming. A comparison of the silicon-nitride tip and the NanoProbe shows that the latter is the only one suited to obtaining clear images.
引用
收藏
页码：184 / 193
页数：10
相关论文
共 50 条
  • [1] Knudsen-Poiseuille transition by means of pneumatic scanning force microscopy
    Bielza, JM
    Kamusewitz, H
    Keller, M
    Paul, D
    LANGMUIR, 2002, 18 (21) : 8129 - 8133
  • [2] Characterization of polymeric membranes by means of scanning force microscopy (SFM) in comparison to results of scanning electron microscopy (SEM)
    Kamusewitz, H
    SchossigTiedemann, M
    Keller, M
    Paul, D
    SURFACE SCIENCE, 1997, 377 (1-3) : 1076 - 1081
  • [3] Membrane-Based Scanning Force Microscopy
    Halg, David
    Gisler, Thomas
    Tsaturyan, Yeghishe
    Catalini, Letizia
    Grob, Urs
    Krass, Marc-Dominik
    Heritier, Martin
    Mattiat, Hinrich
    Thamm, Ann-Katrin
    Schirhagl, Romana
    Langman, Eric C.
    Schliesser, Albert
    Degen, Christian L.
    Eichler, Alexander
    PHYSICAL REVIEW APPLIED, 2021, 15 (02):
  • [4] Surface diagnostics by means of scanning force microscopy (review)
    Bukharaev, AA
    Ovchinnikov, DV
    Bukharaeva, AA
    INDUSTRIAL LABORATORY, 1997, 63 (05): : 265 - 281
  • [5] Single-bond force measured by means of scanning force microscopy
    Lekka, M
    Grybos, J
    Lekki, J
    Stachura, Z
    Styczen, J
    ACTA PHYSICA POLONICA A, 2002, 102 (03) : 355 - 364
  • [6] SCANNING TUNNELING MICROSCOPY AS A MEANS FOR SURFACE CHARACTERIZATION
    BEHM, RJ
    SCANNING MICROSCOPY, 1987, : 61 - 65
  • [7] Analytical characterization of surfaces by scanning force microscopy
    Friedbacher, G
    Resch, R
    Schmitz, I
    Kollensperger, G
    Schreiner, M
    Grasserbauer, M
    ANNALI DI CHIMICA, 1997, 87 (3-4) : 145 - 163
  • [8] Characterization of cobalt nanowires by means of force microscopy
    Garcia, JM
    Asenjo, A
    Vazquez, M
    Aranda, P
    Ruiz-Hitzky, E
    IEEE TRANSACTIONS ON MAGNETICS, 2000, 36 (05) : 2981 - 2983
  • [9] Characterization of PZT films by scanning force microscopy (SFM)
    Zavala, G
    TrolierMcKinstry, SE
    Fendler, JH
    FERROELECTRIC THIN FILMS V, 1996, 433 : 437 - 442
  • [10] Electrical characterization of integrated circuits by scanning force microscopy
    Bohm, C.
    Roths, C.
    Muller, U.
    Beyer, A.
    Kubalek, E.
    Materials science & engineering. B, Solid-state materials for advanced technology, 1994, B24 (1-3): : 218 - 222
12345