SUBSTITUTIONAL SITE CONTROL OF SI IN GAAS BY STOICHIOMETRY CHANGE WITH GA ION-IMPLANTATION

被引:1
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作者
NAKAMURA, K
NOZAKI, T
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D O I
10.1016/0168-583X(89)90192-4
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TH7 [仪器、仪表];
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0804 ; 080401 ; 081102 ;
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页码:308 / 311
页数:4
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