EFFECTIVE CARRIER IONIZATION RATE IN A P-N JUNCTION AT AVALANCHE BREAKDOWN

被引：10

作者：

KENNEDY, DP

OBRIEN, RR

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1965年 / 9卷 / 5-6期

关键词：

D O I：

10.1147/rd.95.0422

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：422 / &

共 50 条

[41] EFFECT OF STRUCTURAL IRREGULARITIES ON AVALANCHE BREAKDOWN IN P-N STEP JUNCTIONS
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[49] EFFECT OF INHOMOGENEITIES ON AVALANCHE BREAKDOWN VOLTAGE OF A P-N-JUNCTION
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[50] CALCULATION OF AVALANCHE BREAKDOWN VOLTAGE OF THE INP P+-N JUNCTION
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