PROPERTIES OF SUBSTRATES FOR LOW-TEMPERATURE QUANTITATIVE MICROSCOPY AND MICROANALYSIS

被引：0
|
作者：
LAMVIK, MK [1 ]
DAVILLA, SD [1 ]
TUTTLE, J [1 ]
机构：
[1] DUKE UNIV,DEPT PHYS,DURHAM,NC 27706
来源：
SCANNING MICROSCOPY | 1989年
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中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：271 / 276
页数：6
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