X-RAY STRUCTURAL ANALYSIS OF MICROIMPURITIES IN GLASSES (EXCHANGE OF EXPERIENCE)

被引：0
|
作者：
MINAKOV, VA
STATIVA, VP
机构：
来源：
INDUSTRIAL LABORATORY | 1965年 / 31卷 / 07期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1036 / &
相关论文
共 50 条
  • [41] STRUCTURAL STUDIES OF OXYNITRIDE GLASSES VIA X-RAY PHOTOELECTRON-SPECTROSCOPY
    WITTBERG, TN
    LOEHMAN, RE
    PANTANO, CG
    AMERICAN CERAMIC SOCIETY BULLETIN, 1981, 60 (08): : 861 - 861
  • [42] Resolving structural modifications of colloidal glasses by combining x-ray scattering and rheology
    Denisov, D.
    Dang, M. T.
    Struth, B.
    Wegdam, G.
    Schall, P.
    SCIENTIFIC REPORTS, 2013, 3
  • [43] X-Ray fluorescence analysis of Ge-As-Se glasses using X-Ray and electron-beam excitation
    Bordovsky, G. A.
    Marchenko, A. V.
    Seregin, P. P.
    Bobokhuzhaev, K. U.
    INORGANIC MATERIALS, 2015, 51 (09) : 939 - 943
  • [44] CRYSTALLIZATION OF PROTEINS FOR X-RAY STRUCTURAL-ANALYSIS
    SEVCIK, J
    BIOLOGIA, 1981, 36 (06) : 467 - 474
  • [45] X-RAY DIFFRACTION ANALYSIS OF STRUCTURAL CHANGES IN GLASS
    GOKULARA.CV
    GOULD, RW
    HENCH, LL
    AMERICAN CERAMIC SOCIETY BULLETIN, 1971, 50 (04): : 414 - &
  • [46] X-ray structural analysis of surface layers (Review)
    Ivanov, AN
    Yagodkin, YD
    INDUSTRIAL LABORATORY, 2000, 66 (05): : 304 - 314
  • [47] Detailed structural analysis of semiconductors with X-ray scattering
    Fewster, PF
    Holy, V
    Andrew, NL
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2001, 4 (06) : 475 - 481
  • [48] NEW INDUSTRIAL X-RAY TUBES FOR STRUCTURAL ANALYSIS
    IOFFE, YK
    NIKOLAEN.GM
    FRIDMAN, EM
    INDUSTRIAL LABORATORY, 1967, 33 (06): : 919 - &
  • [49] STRUCTURAL X-RAY ANALYSIS OF POLYCRYSTALS OF CARBON MARTENSITE
    SHTREMEL, MA
    KAPUTKINA, LM
    PHYSICS OF METALS AND METALLOGRAPHY, 1971, 32 (05): : 97 - 104
  • [50] Structural analysis of an obsidian by X-ray diffraction method
    Okuno, M
    Iwatsuki, H
    Matsumoto, T
    EUROPEAN JOURNAL OF MINERALOGY, 1996, 8 (06) : 1257 - 1264
12345