Denoising and feature extraction for control chart pattern recognition in autocorrelated processes

被引:8
|
作者
Cheng, Hui-Ping [1 ]
Cheng, Chuen-Sheng [2 ]
机构
[1] Ming Dao Univ, Dept Business Adm, Changhua 52345, Taiwan
[2] Yuan Ze Univ, Dept Ind Engn & Management, 135 Yuan Tung Rd, Taoyuan 320, Taiwan
关键词
SPC; statistical process control; pattern recognition; multi-resolution analysis; DWT; discrete wavelet transform; neural network; autocorrelated processes;
D O I
10.1504/IJSISE.2008.020918
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The main purpose of this paper is to develop a neural network-based recogniser for control chart pattern recognition in autocorrelated processes. First, we apply a multi-resolution analysis approach based on Haar Discrete Wavelet Transform (DWT) to denoise, decorrelate and extract distinguished features from autocorrelated data. Second, we introduce a supervised neural network for control chart pattern recognition. The performance of the neural network using features extracted from wavelet analysis as the components of the input vectors is explored and compared. In this study, we investigated three types of unnatural patterns, namely increasing and decreasing trends, cyclic patterns, upward and downward shifts. Extensive comparisons based on simulation study indicate that the proposed neural network performs better than that using raw data as inputs.
引用
收藏
页码:115 / 126
页数:12
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