NEUTRON INDUCED DISPLACEMENT DAMAGE IN INTEGRATED CIRCUITS

被引：0
|
作者：
MCELROY, JA
BOORNARD, A
GANDOLFO, DA
机构：
来源：
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1965年 / 53卷 / 11期
关键词：
D O I：
10.1109/PROC.1965.4394
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1773 / &
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