KOSSEL DIFFRACTION IN PERFECT CRYSTALS - X-RAY STANDING WAVES IN REVERSE

被引:41
|
作者
GOG, T
BAHR, D
MATERLIK, G
机构
[1] Hamburger Synchrotronstrahlungslabor HASYLAB Am Deutschen Elektronen-Synchrotron DESY
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 10期
关键词
D O I
10.1103/PhysRevB.51.6761
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
By virtue of the optical reciprocity theorem, Kossel diffraction in perfect crystals can be viewed as the reverse process of x-ray standing waves. An experimental method can then be devised to determine atomic positions in the bulk or at a surface of a crystal by analyzing the profile of angularly resolved Kossel lines. It is demonstrated that such a technique is sensitive enough to be applied to very dilute atomic concentrations of monolayer equivalency. Experimental results and a quantitative analysis for a buried, 7 thick layer of CoSi2 on a Si(111) substrate reveal the lattice position of Co atoms and confirm that Co-Si bonds form the interface between the CoSi2 layer and its Si substrate. © 1995 The American Physical Society.
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页码:6761 / 6764
页数:4
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